Wafer to chip: X-ray imaging for reduced defect rate

Wafer to chip: X-ray imaging for reduced defect rate

7:51 AM
Using non-destructive imaging methods, a team of scientists has obtained three-dimensional insights into the interior of crystals. They determine important data about line-shaped defects that largely influence the deformation behavior of crystals. These so-called dislocations impede the production of computer chips. The scientists combine two X-ray methods with a special type of light microscopy.

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