Atomic force microscopy: New sensing element for high-speed imaging

Atomic force microscopy: New sensing element for high-speed imaging

8:09 PM
With atomic force microscopy, tiny structures can be imaged. But usually there is a trade of: In order to create pictures quickly, very stiff materials have to be used in the microscope, but they can damage delicate structures such as living cells. Scientists have now found a way around this dilemma.

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